Functional Partitioning Analysis		Optical Component Place/Align/Affix		Material Acquisition & Handling		Design Verification Testing (DVT)
	Physical Partitioning		TE Cooler /Case/Submount Attachment		Kit Release & Control		Qualification Testing
	Substrate Technologies		Hybrid Circuit Fabrication & Attachment		Use of Manufacturing Cells		Manufacturing Test
	Reliability/Failure Modes Analyses		Module Hermetic Seal		Use of Centrally Located Resources		Test Software Methods & Control
	Thermal/Mechanical Analyses		Classified Software Loading		Automation		Test Data Acquisition & Archiving
	Environmental Compatibility Analyses		Custom Anti-Tamper Solutions		WIP Tracking & Reporting
	Product Cost Analyses		Low Cost Packaging Alternatives		Manufacturing Change Management
	Analog/Digital Design				Part Traceability to Lot or Wafer
	Optical Design
	Electrical Analog/Digital Wave Design
	Mechanical Design
	Design Verification Testing (DVT)
	Active & Passive Design Guidelines